Capacitor Schoopage with Ron Demcko from AVX

The Amp Hour · 18 Jul 2022 · 1h 25m · Episode 596

What this episode covers

Ron Demcko, an AVX Fellow with 40 years of experience, joins Dave Jones to analyze a failed film capacitor, concluding that moisture ingress through the epoxy seal is the root cause rather than impulse degradation. They discuss the internal construction of film capacitors, including sputtered metallization and shoopage termination, and explain how moisture causes electrode oxidation and resistance changes. The conversation expands to cover advancements in ceramic capacitors, such as low-inductance LICC and LGA packages, and the reliability of tantalum and polymer capacitors in automotive and aerospace applications.

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